Author: Chanelière T. Fraigne S. Galaup J.-P. Joffre M. Le Gouët J.-L. Likforman J.-P. Ricard D.
Publisher: Edp Sciences
E-ISSN: 1286-0050|20|3|205-211
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.20, Iss.3, 2002-11, pp. : 205-211
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Abstract
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