The UV-induced positive and negative refractive index changes in GeO2-SiO2 films

Author： Zhang L. T.   Wang J.   Xie W. F.   Hou Y.   Zheng J.   Zheng W.   Zhang Y. S.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|32|2|105-108

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.32, Iss.2, 2005-10, pp. : 105-108

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