Author: Bonell F. Bataille A. M. Andrieu S. Tiusan C. Kierren B. Lengaigne G. Lacour D.
Publisher: Edp Sciences
E-ISSN: 1286-0050|43|3|357-361
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.43, Iss.3, 2008-06, pp. : 357-361
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract