Focussing of a transient low energy Cs+ probe for improved NanoSIMS characterizations

Author： Bernheim M.   Wu T. D.   Guerquin-Kern J. L.   Croisy A.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|42|3|311-319

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.42, Iss.3, 2008-04, pp. : 311-319

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