Luminescence and EPR studies of defects in Si-SiO2 films

Author： Baran M.   Bulakh B.   Korsunska N.   Khomenkova L.   Jedrzejewski J.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|27|1-3|285-287

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 285-287

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