Stacking faults and phase transformations in silicon nitride

Author： Milhet X.   Demenet J.-L.   Rabier J.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|4|2|149-156

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.4, Iss.2, 2010-03, pp. : 149-156

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Photoluminescence and X-ray topography measurements onoxidation-induced stacking faults in silicon wafers

By Kakui H.   Fukuzawa M.   Shiraishi Y.   Yamada M.  

EPJ Applied Physics (The), Vol. 27, Iss. 1-3, 2010-03 ,pp. : 447-450

Edp Sciences

Access to resources Recommend Favorite

Detection and characterization of stacking faults by light beam induced current mapping and scanning infrared microscopy in silicon*

By Vève-Fossati C.   Martinuzzi S.  

EPJ Applied Physics (The), Vol. 3, Iss. 2, 2010-03 ,pp. : 123-126

Edp Sciences

Access to resources Recommend Favorite

QUANTITATIVE EXPERIMENTAL STUDY OF DISLOCATIONS AND STACKING FAULTS BY TRANSMISSION ELECTRON MICROSCOPY

By HOWIE A.  

International Materials Reviews, Vol. 6, Iss. 1, 1961-01 ,pp. : 467-503

Maney Publishing

Access to resources Recommend Favorite

Stacking faults in heavily nitrogen doped 4H-SiC

By Irmscher K.   Doerschel J.   Rost H. -J.   Schulz D.   Siche D.   Nerding M.   Strunk H. P.  

EPJ Applied Physics (The), Vol. 27, Iss. 1-3, 2010-03 ,pp. : 243-246

Edp Sciences

Access to resources Recommend Favorite

Metallography of Phase Transformations

By Nutting J.  

International Materials Reviews, Vol. 18, Iss. 1, 1973-03 ,pp. : 37-37

Maney Publishing

Access to resources Recommend Favorite