Author: Gouega A. M. Teste Ph. Andlauer R. Leblanc T. Chabrerie J.-P.
Publisher: Edp Sciences
E-ISSN: 1286-0050|11|2|111-122
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.11, Iss.2, 2010-03, pp. : 111-122
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