Defects in Semiconductors 14

Author: von Bardeleben H.J.  

Publisher: Trans Tech Publications‎

Publication year: 1986

E-ISBN: 9783035704242

P-ISBN(Paperback): 9780878495511

Subject: TB3 Engineering Materials

Keyword: 工程材料学

Language: ENG

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Chapter

Diffusion without Vacancies or Interstitials: A New Concerted Exchange Mechanism

Germanium Impurity Diffusion in Boron Doped Silicon

Diffusion of Tellurium in Silicon

Behaviour of Substitutional Gold in Silicon

Nature and Generation Mechanism of Butterfly-Type Intrinsic Gettering Centers in Oxygen-Free Silicon Crystals

Distribution of Cobalt in Silicon after Phosphorous Diffusion Gettering

Transient Defects Kinetics during Silicon Oxidation and Diffusion Phenomena

Migration of Interstitial Boron in Silicon

Solubility, Diffusion and Ion-Pairing of Cobalt in Extrinsic Silicon at 700°C

Diffusion and Conductivity of Potassium Impurity in Silicon and Germanium

An Overview of Electron Paramagnetic Resonance Studies of Si-SiO2 Interface States

Manganese Luminescence in GaAs/GaAlAs Superlattices

Capacitance and Current Spectroscopy of Perpendicular Transport in Compensated GaAs-GaAlAs Superlattices

Characterization of Electron Traps in GaAs-GaAlAs Superlattices

Defect Generation in the Initial Stages of Epitaxial Growth of GaAs on Silicon by MBE

Atomic Imaging of Surface Defects on Si

Influence of Strain on Silicon Surface and Silicon Oxide Interface Reconstruction

Deep Level at Semiconductor Surfaces

Charged Defect States at Silicon Grain Boundaries

Bulk and Grain Boundary Defects in Polycrystalline ZnO

The Role of Defect Production at Surface and Interface of CdHgTe and ZnHgTe

Electronic Structure of As and P Antisite Defects and Ga Vacancy in GaP and GaAs

EPR Spectra of AsGa Aggregates in GaAs

Endor-Investigation of the Ga Vacancy in GaP

Characterization of Vacancy Defects in As-Grown and Electron Irradiated GaAs by Positron Annihilation

Triplet Spin ODMR from Phosphorous Antisites in Undoped InP

Electronic Structure and Positron States at Vacancies in Semiconductors

Search for the Full Atomic Structure of El2 in GaAs

Bistability and Metastability of VGa in GaAs

EPR Observation of the Arsenic Antisite - Arsenic Vacancy Complex

A Model for the Atomic Configuration of the EL2 Defect in GaAs

The Arsenic Antisite Defect in GaAs and Its Relation to EL2

Observation of New EL2 Related Properties in GaAs. Photodissociation Model of EL2 Metastability

Optical Transition Mechanisms via Excited State and a New Configuration Coordinate Model for EL2 in GaAs

The Energy Position of the EL2 Ground State in GaAs

EL2 Characteristics of In-Doped Vapor Phase Epitaxy GaAs Layers

AsGa-Asi-AsGa Complex as a Model of EL2 Centre in GaAs

Optically-Assisted Thermal Anneal of Metastable Defects in GaAs

Resonant Raman Scattering at Point Defects in GaAs

Infrared Investigations of Persistent Carriers, Photo-Generated during EL2 Bleaching in GaAs

ESR Studies of Semi-Insulating GaAs Crystals

EL2 Quenching Behaviour in Infrared GaAs Transmission Images

Introduction to Metastability: Configuration Coordinate Diagrams

Trends in the Bistable Properties of Iron-Acceptor Pairs in Silicon

Metastable States of the DX Center in AlxGa1-xAs

Environmental Effects in DX (Te) Centers in GaAlAs

Trapping Characteristics of the Dual States of the D-X Center in MBE Grown Si-Doped AlGaAs

Trapping Characteristics and Analysis of Te-Related DX Centers in AlGaAs and GaAsP

Effect of the Host Band Structure on Capture and Emission Processes at DX Centers in AlGaAs

The Ge-Related DX Level in Sn/Ge-Doped AlxGa1-xAs Hetero-Junctions Grown by LPE

A New Model of Deep Donor Centers in AlxGa1-xAs

Optical Nuclear Polarization and Spin-Dependent Reactions in Semiconductors

Evidence of "Coherent" Recombination on a Deep Center from Recombination Enhanced Defect Reactions

Multiphonon Recombination by Bourgoin-Corbett Mechanism

Uniaxial Stress DLTS of Iron-Acceptor Pairs in Silicon

On the Behaviour of Hole Capture with Multiphonon Emission at Deep Level Defects H3 and H4 in p-GaAs

Stress Effects of Deep Centers in Si, New Method to Determine Old Parameter Ξμ

Cathodoluminescence Contrast from Localized Defects in Semiconductors

A Study of Electron Capture Cross Sections of A-Center and Gold Acceptor in Silicon under Uniaxial Stress

Transition Metal Impurities-Induced Nonradiative Recombination Processes in the ZnS Lattice

Zero-Phonon Line of Deep-Level Luminescence in GaAs

Accurate Determination of Capture Time Constant of Interface States in MOS Structures

Application of Optically Detected Magnetic Resonance to the Characterization of Point Defects in Semiconductors

Constant Photo-EPR: A New Method for Deep Level Characterization

Characterization of Deep Levels by Microwave Absorption Spectroscopy

Profiling of Vacancy Defects in Ion-Implanted Si by Slow Positron Beam

Analysis of the Electric Field Influence on the Emission Rate of the Te-Related Center in GaAs0.6P0.4

Optical Isothermal Transient Spectroscopy: Application to the Boron Implantation in GaAs

Scanning Transmission Electron Beam Induced Current in Polycrystalline Silicon

On the Formation of 111In-Donor Atom Pairs in Silicon as Observed by PAC

Acceptor-Donor-Interactions in Silicon Studied by the Pac-Method

Hydrogen Behavior and Hydrogen-Related Defects in Single Crystal Silicon

Hydrogen Diffusion and Hydrogen-Dopant Reactions in Crystalline Silicon

Photoluminescence Detection of the Shallow Impurity Neutralization in GaAs

Selective Hydrogen Passivation of Oxygen-Related Thermal-Donor Clusters in Silicon

Correlation between Hydrogen Diffusion and Donor Neutralization in Hydrogenated n-GaAs: Si

In Studies of the Electron-Irradiated Silicon Crystal Grown in Hydrogen Atmosphere

The Optical Cross-Section of 3d Impurity Induced Transitions in III-V and II-VI Semiconductors

Transition-Metal Luminescence in III-V Alloys

The Importance of Random Strain in Deep Level Jahn-Teller Systems Studied by TD-EPR

Identification of the Co1+ Double Acceptor State in GaAs

Spectroscopy of GaAs and InP Grown in the Presence of Rare Earth Elements

Vanadium in GaAs and GaP

Properties of Titanium in GaAs and InP

Study of Transition Metal Deep Donor Levels in InP

The Donor Level Ti3+/Ti4+ in InP: Electrical and Optical Properties

Study of the Cr 2+ Luminescence in GaAs as a Function of Hydrostatic Pressure

Optical, Electrical and EPR Studies of GaAs:Ni

The Luminescence at 0.844 eV in GaAs:Cr - A Zeeman Spectroscopy

Optical Detection of Magnetic Resonance in the Optically Excited 2F5/2-State of Yb3+ in InP

On the Evidence for the Effect of Local Symmetry on the Photoionization Spectrum of Fe2+ in InP

Non-Stationary Infrared-Optical Processes Involving Deep Impurities in III-V Compound Semiconductors

Optically-Detected Magnetic Resonance of Gold Centres in Zinc Selenide

Structure of Pd, Pt and Au Impurities in Silicon: The Energy Levels under Uniaxial Stress and Hydrostatic Pressure

Interstitial 3d Transition Metal Impurities in Silicon: An Ab Initio Cluster Study

Photoluminescence Studies on Gallium-Related Deffects in Silicon

Identification of the Energy Levels of Si:Pd by DLTS

Electrons of 3d Transition Metals in Silicon

High Resolution Transmission Electron Microscopy of Semiconductors and Their Defects

Classification of Defects in Plastically Deformed Silicon

The Growth Mechanism of Dislocation Loops in Arsenic Implanted Silicon

The Role of Point Defects in the Nucleation of Film Edge Induced Dislocations in Silicon

Structural Features in the Photoluminescence from Widely Dissociated Straight Partial Dislocations in Silicon

Defect-Related Luminescence in Molecular Beam Epitaxy Grown CdTe Films*

Structure of Dislocations in Plastically-Deformed, High Purity GaAs

Dislocation Substructures and Plasticity of GaAs below 400°C as a Function of Doping

The Electrical Activity of Dislocation Slip Planes in Semiconductor Crystals

TEM Observation of Dislocations in In Doped GaAs after High Temperature Plastic Deformation

Dislocations in Plastically Deformed GaAs:Cr Thermal Conductivity Measurements

Glide of α and β Dislocations in GaAs

Plasticity of Cd0.66 Hg0.34 Te TEM Observations of Dislocations

Dangling Bonds in a Dislocation Core in Ge. Do They Exist?

On the Mobility of 1/6 (112) Partial Dislocations under High Stress in Semi-Insulating GaAs

ODMR Observation of Close Frenkel Pairs in Electron-Irradiated ZnSe

Electrical Compensation, Electron and Hole Traps in Electron Irradiated ZnSe

Radiation Damage Experiments with ZnO at Low Temperatures

Saturation Spectroscopy and Fluorescence in ZnO:Co2+

ODMR-MCD Study of the Zinc Vacancy and Related Complexes in ZnSe

Photoluminescence Spectroscopy of Proton Implantation Induced Defects in CdTe and ZnTe

Acceptors and Donors in the Wide-Gap Semiconductors ZnO and SnO2

On the Influence of Doping and Annealing on Oxygen-Related Defects in Silicon

The Electronic Structure of the Oxygen-Vacancy Complex in Silicon

Influence of Oxygen Precipitates on the Solution of Transition Metals in Silicon

Enhanced Oxygen Diffusion in Silicon at Low Temperatures

The 3942 cm-1 Optical Band in Irradiated Crystalline Silicon

N-Concentration Dependence of Thermal Annealing Behavior of Substitutional N Impurities in Pulsed-Laser Annealed Silicon

Theoretical Investigation of Deep Level Complexes Related to Carbon and Oxygen Impurities in Silicon

Chalcogen Double Donors in Silicon

The Ultraviolet Absorption due to Single Substitutional Nitrogen in Diamond

The ESR Investigation of a Singly Ionized Sulphur Centre in Ib Diamonds

Electronic and Vibrational Absorption of Interstitial Carbon in Silicon

Ion-Implanted Oxygen Isotopes in Silicon

Far-IR Spectroscopy of Oxygen Donors in Germanium

Identification of the Carbon Associated Radiation Damage Levels in Silicon

Thermal Donors in Silicon - 1986

Preferential Alignment of Thermal Donors in Si

Time Resolved Study of Thermal Donor Related Luminescence Lines in Silicon

Effects of 450°C Thermal Annealing Upon Oxygen Precipitation in B-Doped CZ Si Wafers

Evidence for an Inhomogeneous Distribution of Thermal Donors in Silicon from Electrical and Optical Measurements

The New Donors in Silicon: The Effect of the Inversion Layers Surrounding Precipitates

Early Stage of the New Donors Formation in Cz-Silicon

Properties of the Shallow Thermal Donors in CZ-Silicon as Studied by Photothermal Ionization Spectroscopy (PTIS)

Electronic Properties of Deep Level Defects in Thermally Annealed CZ Silicon

Oxygen Endor of Thermal Donors in Silicon

A Model for the Density of Oxidation Induced Stacking Faults in Silicon

Enhanced Oxygen Diffusion in Silicon at Thermal Donor Formation Temperature

Radiative Defects in Electron Irradiated InP

Thermal Transformation of the Electron-Irradiation-Induced Defect H4 in p Type InP

Study of Electron Irradiation-Induced Defects in N-Type Active Layer of GaAs Mesfet

Electron Microscope Observation of Highly Disordered Regions in Neutron Irradiated Germanium

Climbing of Nearly Screw Dislocations in InSb Thin Foils Irradiated in a High Voltage Electron Microscope

Comparison of Electron Paramagnetic Resonance and Transport Data during Thermal Recovery of Fast Neutron Irradiated GaAs

Endor Study of Radiation Induced Defects in Semi-Insulating GaP

Low Temperature Electron Irradiation Induced Defects in N-GaSb

Electron Hopping between Bombardment Induced Defects in Gallium Arsenide

Ga Antisite Defects in Neutron Irradiated and Annealed GaAs?

Annealing of Irradiated Highly Phosphorous-Doped Czochralski Silicon

Cu-Related Deep Levels in Si and the Interaction between Cu and Irradiation Defects

Subthreshold Radiation Damage in Silicon: Carbon Isotope Measurements on Cs-SiI-Cs Complexes

Experimental Study of Divacancy in Silicon

New Impurity-Defect Reactions in Silicon

Photoluminescence Study of Fe2+ in InP1-xAsx:Fe Alloys

Electron Microscopy Data for Threshold Energy of Point Defect Creation in Silicon

Beam-Induced Annealing of Defects Created by Imlantation at 30 K in Si

Annealing Behaviour of High Concentration of Sn and Sb Implanted in Silicon

Structural Defects in Ion-Implanted Silicon Observed by Perturbed Angular Correlation

Defects Related to Nitrogen Implantation in Silicon Single Crystals

Precipitate Morphologies in Oxygen - Ion Implanted Silicon: A High Resolution Electron Microscopy Study

Dose Dependence of Defects in Silicon Produced by High Dose, High Temperature O+ Implantation

Investigation of the Lattice Defects in P Ion Implanted Silicon

Interaction of Point Defects with Implanted Hydrogen in Undoped Germanium

Evolution of Defect Structures around Te Implanted in GaAs during Solid Phase Epitaxial Regrowth

As-Implanted Lattice Sites of Dopants in Semiconductors

Defect Structures in Ion-Implanted InSb

Defects and Optically Active Transition and Rare Earth Elements in III-V and II-VI Semiconductors and Diamond

Zn-Impurity-Induced Structual Disorder in AlGaAs Alloy

Study of Deep Levels in AlyGaxIn1-x-y P Material Grown by Movpe

Effects of Annealing on Electron Trap and Free Carrier Concentration in n-Type GaAs

Donor Identification in Bulk Gallium Arsenide

Observation of Stoichiometry Changes Beneath Metal Contacts on GaAs

Photoluminescence Studies near Residual Dislocations in In-Alloyed GaAs

Spatial Distribution of Point Defects and Complexes in Semi-Insulating LEC and Si-Doped GF Grown GaAs Crystals

Detection of Non Stoichiometric Vacancy Defects in CdTe, HgTe and Hg1-x CdxTe by Positron Annihilation

Native Defects in β-Sic

Photoluminescence of Defects Produced by Reactive Ion Etching of Silicon

Semi-Insulating Behavior in Undoped LEC InP after Annealing in Phosphorous

Radiative Recombination Mechanism of Deep Levels in GaAs

Author Index

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