In-situ TEM Study of Dislocation-Interface Interactions
( The Transmission Electron Microscope - Theory and Applications )
Publication series ： The Transmission Electron Microscope - Theory and Applications
Author： Nan Li and Jian Wang
Publisher： IntechOpen
Publication year： 2015
E-ISBN: INT5945760880
P-ISBN(Paperback): 9789535121503
P-ISBN(Hardback): 9789535121503
Subject： TH742 显微镜
Keyword： 显微镜
Language： ENG
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
In-situ TEM Study of Dislocation-Interface Interactions
Description
In this chapter, we highlighted the in situ transmission electron microscope (TEM) observation of the interactions of dislocations with three types of interfaces: (i) twin boundaries in Cu; (ii) metallic interphase boundaries; and (iii) metal/ceramic interfaces. Interface structures, interface properties, and dislocation-interface interactions are characterized in a high-resolution TEM. These knowledge provided insights into the understanding of the physical properties of materials, developing materials modeling tools incorporating interface deformation physics, and designing materials with desired properties.
Chapter