Publication series : Advanced Holography - Metrology and Imaging
Author:
Sergio De Nicola Andrea Geltrude Massimiliano Locatelli Kais Al-Naimee
Publisher: IntechOpen
Publication year: 2011
E-ISBN: INT0102719827
P-ISBN(Paperback): 9789533077291
P-ISBN(Hardback): 9789533077291
Subject: TN4 microelectronics, integrated circuit (IC)
Keyword: 微电子学、集成电路(IC)
Language: ENG
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Infrared Holography for Wavefront Reconstruction and Interferometric Metrology