Examination of CoNiCu thin films by using XRF and XRD

Author: Söğüt Ö.   Dönük Ç.   Apaydın G.   Bakkaloğlu Ö.F.  

Publisher: NRC Research Press

ISSN: 1208-6045

Source: Canadian Journal of Physics, Vol.92, Iss.5, 2014-01, pp. : 435-439

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next