Thickness dependence of photoluminescence-decay profiles of exciton-exciton scattering in ZnO thin films

Author： Wakaiki Shuji   Ichida Hideki   Kawase Toshiki   Mizoguchi Kohji   Kim DaeGwi   Nakayama Masaaki   Kanematsu Yasuo  

Publisher： Springer Publishing Company

ISSN： 1434-6028

Source： The European Physical Journal B - Condensed Matter, Vol.86, Iss.9, 2013-09, pp. : 1-4

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