![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Kim Young-Hun Lee In-Kyu Song Yo-Seung Lee Myung-Hyun Kim Bae-Yeon Cho Nam-Ihn Lee Deuk
Publisher: Springer Publishing Company
ISSN: 1738-8090
Source: Electronic Materials Letters, Vol.10, Iss.2, 2014-03, pp. : 445-449
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Santhosh M V Deepu D R Geethu R Kumar K Rajeev Kartha C Sudha Vijayakumar K P
Semiconductor Science and Technology, Vol. 29, Iss. 11, 2014-11 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Xiaoyan Dai Chengwu Shi Yanru Zhang Ni Wu
Journal of Semiconductors, Vol. 36, Iss. 7, 2015-07 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
International Journal of Sensors Wireless Communications and Control, Vol. 4, Iss. 2, 2014-12 ,pp. :