A High Quality Depth Map Upsampling Method Robust to Misalignment of Depth and Color Boundaries

Author： Kim Jaekwang   Lee Jaeho   Han Seung-Ryong   Kim Dowan   Min Jongsul   Kim Changick  

Publisher： Springer Publishing Company

ISSN： 1939-8018

Source： Journal of Signal Processing Systems, Vol.75, Iss.1, 2014-04, pp. : 23-37

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