Thermal contact resistance at the Nb/Cu interface as a limiting factor for sputtered thin film RF superconducting cavities

Author: Palmieri V   Vaglio R  

Publisher: IOP Publishing

E-ISSN: 1361-6668|29|1|15004-15015

ISSN: 0953-2048

Source: Superconductor Science and Technology, Vol.29, Iss.1, 2016-01, pp. : 15004-15015

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