Publisher: IOP Publishing
E-ISSN: 1361-6501|26|12|125010-125016
ISSN: 0957-0233
Source: Measurement Science and Technology, Vol.26, Iss.12, 2015-12, pp. : 125010-125016
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Surface profile measurement by terahertz interferometric phase imaging
Journal of Physics: Conference Series , Vol. 276, Iss. 1, 2011-02 ,pp. :
Luminance waves in electroluminescent cells.
Journal de Physique Appliqué, Vol. 23, Iss. S3, 1962-03 ,pp. :
Measurement of the wavefront of XUV sources
Le Journal de Physique IV, Vol. 11, Iss. PR2, 2001-07 ,pp. :