Measurement of illite particle thickness using a direct Fourier transform of small-angle X-ray scattering data

Author： Shang Chao   Rice James A.   Eberl Dennis D.   Lin Jar-Shyong  

Publisher： The Clay Minerals Society

ISSN： 0009-8604

Source： Clays and Clay Minerals, Vol.51, Iss.3, 2003-06, pp. : 293-300

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