Author: von Korff Schmising C. Bargheer M. Kiel M. Zhavoronkov N. Woerner M. Elsaesser T. Vrejoiu I. Hesse D. Alexe M.
Publisher: Springer Publishing Company
ISSN: 0946-2171
Source: Applied Physics B, Vol.88, Iss.1, 2007-06, pp. : 1-4
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Current developments in time-resolved X-ray diffraction
By Techert S.
Crystallography Reviews, Vol. 12, Iss. 1, 2006-01 ,pp. :
Strain analysis by X-ray diffraction
Thin Solid Films, Vol. 319, Iss. 1, 1998-04 ,pp. :
By Dubrovinskaia N. Dubrovinsky L. Hanfland M. Hofmann M.
International Journal of High Pressure Research, Vol. 32, Iss. 4, 2012-12 ,pp. :