Accurate time delay determination for femtosecond X-ray diffraction experiments

Author: von Korff Schmising C.   Bargheer M.   Kiel M.   Zhavoronkov N.   Woerner M.   Elsaesser T.   Vrejoiu I.   Hesse D.   Alexe M.  

Publisher: Springer Publishing Company

ISSN: 0946-2171

Source: Applied Physics B, Vol.88, Iss.1, 2007-06, pp. : 1-4

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