Structural characterization and optoelectronic properties of GaN thin films on Si(111) substrates using pulsed laser deposition assisted by gas discharge

Author： Tong X.L.   Zheng Q.G.   Hu S.L.   Qin Y.X.   Ding Z.H.  

Publisher： Springer Publishing Company

ISSN： 0947-8396

Source： Applied Physics A, Vol.79, Iss.8, 2004-12, pp. : 1959-1963

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