Oxidation behaviour and strength degradation of a Yb2O3-SiO2-doped hot-pressed silicon nitride between 1200 and 1500°C

Author： Guo Shuqi   Hirosaki Naoto   Nishimura Toshiyuki   Yammoto Yoshinobu   Mitomo Mamoru  

Publisher： Taylor & Francis Ltd

ISSN： 0141-8610

Source： Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.82, Iss.16, 2002-11, pp. : 3027-3043

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