Constant-stress accelerated life test of white organic light-emitting diode based on least square method under Weibull distribution

Author： Zhang Jianping Liu Chao Cheng Guoliang Chen Xiao Wu Jionglei Zhu Qunzhi Zhang Laichang

Publisher： Taylor & Francis Ltd

ISSN： 1598-0316

Source： Journal of Information Display, Vol.15, Iss.2, 2014-04, pp. : 71-75

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