Analytical Techniques for Thin Films
：Treatise on Materials Science and Technology, Vol. 27
Publication subTitle ：Treatise on Materials Science and Technology, Vol. 27
Author： Tu K. N.;Rosenberg R.
Publisher： Elsevier Science
Publication year： 2017
E-ISBN: 9781483218311
P-ISBN(Paperback): 9780123418272
Subject： TB3 Engineering Materials
Keyword： 一般工业技术
Language： ENG
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Description
Treatise on Materials Science and Technology, Volume 27: Analytical Techniques for Thin Films covers a set of analytical techniques developed for thin films and interfaces, all based on scattering and excitation phenomena and theories. The book discusses photon beam and X-ray techniques; electron beam techniques; and ion beam techniques. Materials scientists, materials engineers, chemical engineers, and physicists will find the book invaluable.