The electric field jump—detection of damaged Nb barrier in MgB

Author: Gajda D   Zaleski A J   Morawski A   Rindfleisch M   Thong C   Tomsic M  

Publisher: IOP Publishing

E-ISSN: 1361-6668|28|11|115003-115017

ISSN: 0953-2048

Source: Superconductor Science and Technology, Vol.28, Iss.11, 2015-11, pp. : 115003-115017

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