Standardization of proton-induced x-ray emission technique for analysis of thick samples

Author: Shad Ali   Johar Zeb   Abdul Ahad   Ishfaq Ahmad   M Haneef   Jehan Akbar  

Publisher: IOP Publishing

E-ISSN: 1741-4199|24|9|90601-90606

ISSN: 1674-1056

Source: Chinese Physics B, Vol.24, Iss.9, 2015-09, pp. : 90601-90606

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Abstract