Verification of Faulty Mechanism for Fan-Out Wafer Level Package Using Numerical Analysis

Publisher: Trans Tech Publications

E-ISSN: 1662-7482|2015|789|609-612

ISSN: 1660-9336

Source: Applied Mechanics and Materials, Vol.2015, Iss.789, 2015-10, pp. : 609-612

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract