Atomic Transport in Nano-Crystalline Silicides Studied by In Situ Auger Electron Spectroscopy: Interfacial Reaction Effect

Publisher： Trans Tech Publications

E-ISSN： 1662-9507|2015|363|12-20

ISSN： 1012-0386

Source： Defect and Diffusion Forum, Vol.2015, Iss.363, 2015-06, pp. : 12-20

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