Impact of Different Mobility Models on 32nm Node UTBB SOI MOSFETs

Publisher: Trans Tech Publications

E-ISSN: 1662-8985|2015|1109|88-93

ISSN: 1022-6680

Source: Advanced Materials Research, Vol.2015, Iss.1109, 2015-07, pp. : 88-93

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract