Peculiarities of SiO₂-M_xO_y (where М – Mn, Fe, Co, Ni) Thin Films Formation

E-ISSN： 1662-9795|2015|670|44-48

ISSN： 1013-9826

Source： Key Engineering Materials, Vol.2015, Iss.670, 2016-02, pp. : 44-48

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