Structural and Magnetic Investigation of Cu, Co Substituted NiFe₂O₄ Thin Films by Scanning Probe Microscopy (AFM, MFM)

E-ISSN： 1662-9752|2015|830|589-591

ISSN： 0255-5476

Source： Materials Science Forum, Vol.2015, Iss.830, 2015-10, pp. : 589-591

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