Electrical Characterization of a 4H-SiC JFET Wafer: DC Parameter Variations for Extreme Temperature IC Design

Publisher: Trans Tech Publications

E-ISSN: 1662-9752|2015|821|781-784

ISSN: 0255-5476

Source: Materials Science Forum, Vol.2015, Iss.821, 2015-07, pp. : 781-784

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Abstract