Author: Chuanwei Liu Shenqiang Zhai Jinchuan Zhang Yuhong Zhou Zhiwei Jia Fengqi Liu Zhanguo Wang
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.36, Iss.9, 2015-09, pp. : 94009-94012
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Abstract
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