Fermi level pinning effects at gate–dielectric interfaces influenced by interface state densities

Author： Wen-Ting Hong   Wei-Hua Han   Qi-Feng Lyu   Hao Wang   Fu-Hua Yang  

Publisher： IOP Publishing

E-ISSN： 1741-4199|24|10|107306-107310

ISSN： 1674-1056

Source： Chinese Physics B, Vol.24, Iss.10, 2015-10, pp. : 107306-107310

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