Author: Zhixiong Ren Kefeng Zhang Lanqi Liu Cong Li Xiaofei Chen Dongsheng Liu Zhenglin Liu Xuecheng Zou
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.36, Iss.9, 2015-09, pp. : 95002-95011
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Abstract
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