Monte Carlo model for the analysis and development of III-V Tunnel-FETs and Impact Ionization-MOSFETs

Publisher： IOP Publishing

E-ISSN： 1742-6596|647|1|231-234

ISSN： 1742-6596

Source： Journal of Physics: Conference Series , Vol.647, Iss.1, 2015-10, pp. : 231-234

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