Radiation tolerance studies of silicon microstrip sensors for the CBM Silicon Tracking System

Publisher: IOP Publishing

E-ISSN: 1742-6596|668|1|575-576

ISSN: 1742-6596

Source: Journal of Physics: Conference Series , Vol.668, Iss.1, 2016-01, pp. : 575-576

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next