Development of soft X-ray emission spectrometer for EPMA/SEM and its application

Publisher: IOP Publishing

E-ISSN: 1757-899X|109|1|192-202

ISSN: 1757-899X

Source: IOP Conference Series: Materials Science and Engineering, Vol.109, Iss.1, 2016-02, pp. : 192-202

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next