La spectromicroscopie XPEEM avec le rayonnement synchrotron*

Author: Barrett N.   Renault O.  

Publisher: Edp Sciences

E-ISSN: 1778-3771|97|2|101-122

ISSN: 0032-6895

Source: Matériaux & Techniques, Vol.97, Iss.2, 2009-06, pp. : 101-122

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Abstract