ESD Protection Methodologies ：From Component to System

Publication subTitle ：From Component to System

Author： Bafleur   Marise;Caignet   Fabrice;Nolhier   Nicolas  

Publisher： Elsevier Science‎

Publication year： 2017

E-ISBN: 9780081011607

P-ISBN(Paperback): 9781785481222

Subject： TM Electrotechnical

Keyword： 电工技术

Language： ENG

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Description

Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and shows, through a number of concrete studies, that the best approach in terms of robustness and cost-effectiveness consists of implementing a global strategy of ESD protection. ESD Protection Methodologies begins by exploring the various normalized test techniques that are used to qualify ESD robustness as well as characterization and defect localization methods aimed at implementing corrective measures. Due to the increasing complexity of integrated circuits, it is important to be able to provide a simulation in which the implemented ESD protection strategy provides the desired protection, while not harming the performance levels of the circuit. Therefore, the main features and difficulties related to the different types of simulation, finite element, SPICE-type and behavioral, are then studied. To conclude, several case studies are presented which provide real-life examples of the approaches explained in the previous chapters and validate a number of the strategies from component to system level.

  • Provides a global ESD protection approach from component to system, including both the proposal of investigation techniques and predictive simulation methodologies
  • Addresses circuit and system designers as well as fa

Chapter

Front Cover

ESD Protection Methodologies: From Component to System

Copyright

Contents

Foreword 1

Foreword 2

Preface

Introduction

I.1. Origin of electrostatic discharge

I.2. Impact on the electronics

I.3. ESD Protected Area or “EPA”

I.4. Conclusion

1. ESD Standards: From Component to System

1.1. Standards: From component to system

1.2. Component level standards: HBM, MM, CDM, HMM

1.3. Standards at the system level

1.4. Conclusion

2. Characterization Techniques

2.1. Component level electrical characterization techniques

2.2. System measurement methods

2.3. Injection methods

2.4. Failure analysis techniques

2.5. Conclusion

3. Protection Strategies Against ESD

3.1. ESD design window

3.2. Elementary protective components

3.3. Discrete protections

3.4. Challenges of the protection strategy at the system level

3.5. Conclusion

4. Modeling and Simulation Methods

4.1. Physical simulation: TCAD approach to the optimization of elementary protections

4.2. Electrical simulation: Compact modeling

4.3. Behavioral simulation for prediction at the system level

4.4. Conclusion

5. Case Studies

5.1. Case 1: Interaction between two types of protection

5.2. Case 2: Detection of latent defaults caused by CDM stress

5.3. Case 3: The impact of decoupling capacitors in propagation paths in a circuit

5.4. Case 4: Functional failure linked to a decoupling capacitor

5.5. Case 5: Fatal failure in an LIN circuit

5.6. Case 6: Functional failure in a 16-bit microcontroller

5.7. Conclusion

Conclusion

General rules for a global ESD protection strategy

Conclusion

Bibliography

Index

Back Cover

The users who browse this book also browse


No browse record.