Publisher： John Wiley & Sons Inc
E-ISSN： 0365-110x|19|4|683-684
ISSN： 0365-110x
Source： Acta Crystallographica, Vol.19, Iss.4, 1965-10, pp. : 683-684
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
The correlation of intersecting layers of X‐ray intensity data
Acta Crystallographica, Vol. 13, Iss. 3, 1960-03 ,pp. :
Access to resources
Recommend
The X‐ray anomalous reflexions from diamond
Acta Crystallographica, Vol. 8, Iss. 4, 1955-04 ,pp. :
Instrumental corrections for X‐ray reflexions from thin monocrystalline films
Acta Crystallographica, Vol. 23, Iss. 4, 1967-10 ,pp. :
The interpretation of diffuse X‐ray reflexions from single crystals. II
Acta Crystallographica, Vol. 6, Iss. 6, 1953-06 ,pp. :