Publisher: John Wiley & Sons Inc
E-ISSN: 0365-110x|16|7|705-706
ISSN: 0365-110x
Source: Acta Crystallographica, Vol.16, Iss.7, 1963-07, pp. : 705-706
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
How Precise Are the Positions of Computer-Determined Peaks?
Applied Spectroscopy, Vol. 52, Iss. 12, 1998-12 ,pp. :
On the Fourier treatment of distortion broadening in X‐ray diffraction
Acta Crystallographica, Vol. 12, Iss. 6, 1959-06 ,pp. :
Computer aided thermal analysis
By Strezov V. Lucas J. Strezov L.
Journal of Thermal Analysis and Calorimetry, Vol. 72, Iss. 3, 2003-06 ,pp. :
A three‐dimensional analysis of instrumental broadening in X‐ray measurements
Acta Crystallographica, Vol. 18, Iss. 4, 1965-04 ,pp. :