On the visual estimation of X‐ray reflexion intensities from upper‐level Weissenberg photographs. II. Charts for the correction of reflexion spot extension

Publisher： John Wiley & Sons Inc

E-ISSN： 0365-110x|9|10|819-821

ISSN： 0365-110x

Source： Acta Crystallographica, Vol.9, Iss.10, 1956-10, pp. : 819-821

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