Fourier transform methods for the slit‐height correction in small‐angle scattering

Publisher: John Wiley & Sons Inc

E-ISSN: 0365-110x|17|2|138-142

ISSN: 0365-110x

Source: Acta Crystallographica, Vol.17, Iss.2, 1964-02, pp. : 138-142

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