An X‐ray diffraction method for the study of substructure of crystals

Publisher: John Wiley & Sons Inc

E-ISSN: 0365-110x|7|11|729-732

ISSN: 0365-110x

Source: Acta Crystallographica, Vol.7, Iss.11, 1954-11, pp. : 729-732

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next