From optical to terahertz, frequency metrology with a single ion

Author: Champenois C.   Hagel G.   Houssin M.   Knoop M.   Vedel M.   Zumsteg C.   Vedel F.  

Publisher: Edp Sciences

E-ISSN: 1286-4838|32|2-3|25-31

ISSN: 0003-4169

Source: Annales de Physique, Vol.32, Iss.2-3, 2008-05, pp. : 25-31

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Abstract