Effect of point defects on lattice constant in MgO thin film deposited on silicon(0 0 1) substrate

Author: Kaneko S.   Nagano T.   Ito T.   Yasui M.   Ozawa T.   Soga M.   Motoizumi Y.   Funakubo H.   Yoshimoto M.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|58|1|10302-10302

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.58, Iss.1, 2012-04, pp. : 10302-10302

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