Non destructive testing of works of art by terahertz analysis

Author: Bodnar Jean-Luc   Metayer Jean-Jacques   Mouhoubi Kamel   Detalle Vincent  

Publisher: Edp Sciences

E-ISSN: 1286-0050|64|2|21001-21001

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.64, Iss.2, 2013-11, pp. : 21001-21001

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Abstract