

Author: Lamrani Sabrina Guittoum Abderrahim Schäfer Rudolf Pofahl Stefan Neu Volker Hemmous Messaoud Benbrahim Nassima
Publisher: Edp Sciences
E-ISSN: 1286-0050|74|3|30302-30302
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.74, Iss.3, 2016-06, pp. : 30302-30302
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Abstract
We study the effect of thickness on the structural and magnetic properties of permalloy thin films, evaporated on glass substrate. The films thicknesses range from 16 to 90 nm. From X-ray diffraction spectra analysis, we show that the thinner films present a ‹1,1,1› preferred orientation. However, the thicker films exhibit a random orientation. The grains size increases and the lattice parameter decreases with increasing thickness. The magnetic force microscopy observations display cross-tie walls features only for the two thicker films (60 and 90 nm thick films). The magnetic microstructure, carried out by Kerr microscopy technique, shows the presence of magnetic domains changing with the direction of applied magnetic field. The coercive field,
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