Nanostructural defects evidenced in failing silicon-based NMOS capacitors by advanced failure analysis techniques

Author： Faivre Emilie Llido Roxane Putero Magali Fares Lahouari Muller Christophe

E-ISSN： 1286-0050|66|1|10103-10103

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.66, Iss.1, 2014-04, pp. : 10103-10103

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Use of microscopy techniques in failure analysis of the plastic injection molded parts to prevent the risks of serial defects in the assembly processes

MATEC Web of conference, Vol. 112, Iss. issue, 2017-07 ,pp. : 04009-04009

Edp Sciences

Access to resources Recommend Favorite

Stain-etched porous silicon nanostructures for multicrystalline silicon-based solar cells

By Ben Rabha M. Hajji M. Belhadj Mohamed S. Hajjaji A. Gaidi M. Ezzaouia H. Bessais B.

EPJ Applied Physics (The), Vol. 57, Iss. 2, 2011-12 ,pp. : 21301-21301

Edp Sciences

Access to resources Recommend Favorite

Advanced techniques for vibration analysis of car structures

By Barla A. Toniato G. Chiesa L.

INTER-NOISE and NOISE-CON Congress and Conference Proceedings, Vol. 1993, Iss. 5, 1993-08 ,pp. : 703-708

Institute of Noise Control Engineering

Access to resources Recommend Favorite

Integration of a Micro-Temperature Sensor on a Silicon-Based Micro-Reformer

By Lee Chi-Yuan Lin Chen-Hen

International Journal of Green Energy, Vol. 9, Iss. 7, 2012-10 ,pp. : 612-621

Taylor & Francis Ltd

Access to resources Recommend Favorite

Urban stormwater: the analysis of the failure of the alternative techniques and the management of quality

By Alfakih E. Barraud S. Azzout Y. Chocat B.

Water Science and Technology, Vol. 32, Iss. 1, 1995-01 ,pp. : 33-39

Elsevier

Access to resources Recommend Favorite