Charge storage characteristics of atomic layer deposited ZrO2/Al2O3 multilayered films

Author: Tang Zhenjie   Li Rong   Zhu Xinhua   Liu Zhiguo  

Publisher: Edp Sciences

E-ISSN: 1286-0050|60|3|30301-30301

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.60, Iss.3, 2012-12, pp. : 30301-30301

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract