Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation

Author: Rolland Nicolas   Vurpillot François   Duguay Sébastien   Blavette Didier  

Publisher: Edp Sciences

E-ISSN: 1286-0050|72|2|21001-21001

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.72, Iss.2, 2015-11, pp. : 21001-21001

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Abstract